JEOL 2010F 200 kV FASTEM FEG TEM/STEM

Point-to-Point Resolution (HRTEM)= 0.194 nm

Minimum Spot Size in STEM mode  = 0.14 nm

Attachments:

GATAN GIF 2000 Energy Filter

JEOL bright and dark field STEM detectors

GATAN bright and dark field STEM detectors

Oxford Instruments ISIS/Inca  Energy Dispersive X-ray Spectroscopy System with Oxford Pentafet Ultrathin Window Detector (UTW)

Analytical Capabilities:

High resolution TEM imaging, electron diffraction, convergent beam diffraction, energy filtered imaging (EFTEM spectral imaging, STEM spectral imaging), electron energy loss spectroscopy, Z-contrast STEM imaging, energy dispersive X-ray analysis

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