Facilities


Transmission electron microscopes

  • JEOL 2010F Field Emission Gun Scanning Transmission Electron Microscope (FEG/STEM)

    This instrument has an exceptional array of analytical capabilities including energy filtered imaging (EFTEM), electron energy loss spectroscopy (EELS), X-ray microanalysis and X-ray mapping at the sub-nm level, and bright- and dark-field STEM imaging, as well as traditional TEM techniques such as electron diffraction and high-resolution imaging. This TEM has a spot size of 0.14 nm in TEM mode and 0.16 nm in STEM mode. It also has a high-angle annular dark-field detector (HAADF) for atomic resolution Z-contrast imaging in the STEM mode. Our instrument is also equipped with a GATAN image filtering (GIF) system for energy-filtered TEM (EFTEM) and electron energy loss spectroscopy (EELS), and an Oxford ultrathin window EDS detector connected to an Oxford ISIS/INCA X-ray analysis system. The instrument also has a GATAN TV camera for instrument alignment and a GATAN multiscan CCD camera (as integral part of the GIF) for digital image acquisition. We added a GATAN ES500W 27 Erlangshen wide-field camera to the instrument to facilitate the acquisition of digital electron diffraction patterns. The JEOL FASTEM interface allows complete and remote operation of all the microscope parameters via a Windows 2000 computer.

    JEOL 2010F FASTEM Field Emission Gun Scanning Transmission Electron Microscope (STEM/TEM)

  • JEOL 2010 High Resolution Transmission Electron Microscope (HRTEM)

    JEOL 2010 200kV high-resolution transmission electron microscope capable of a 0.19 nm point-to-point resolution. The instrument is fitted with a GATAN Orius high speed CCD camera for digital image acquisition. The EDS system on this instrument is a new Oxford INCA system with an ultra thin window EDS detector capable of detecting all elements down to boron.

    JEOL 2010 High Resolution Transmission Electron Microscope (HRTEM)


Specimen preparation equipment

  • CMEM Facilities - Focused Ion Beam / Scanning Electron Microscope

    The FEI Quanta 3D Field-Emission Electron (FEG) Dual beam focused ion beam has resolution ~1 nm and can be used for the characterization and analysis of samples. This instrument allows us to take high-resolution FEG-SEM images in different modes such as high-vacuum, low-vacuum and environmental scanning electron microscopy (ESEM), which can be used to study uncoated samples under controlled vacuum conditions. It is capable of nanomachining applications using the ion beam column. The instrument is equipped with in-situ sample lift-out capabilities for removing fragments from samples using an Omniprobe AutoProbe 200.2 micromanipulator. In addition, the instrument also is equipped with an EDAX Genesis EDS system with an Apollo 40 SSD detector for X-ray microanalysis, a TSL EBSD system for electron crystallography, and Pt and W deposition source.

    FEI Quanta 3D Field-Emission Electron (FEG) Dual beam focused ion beam